Yanbo Bai
Coherent Inc., USA
Title: Characterization of optically pumped semiconductor lasers in pulsed mode
Biography
Biography: Yanbo Bai
Abstract
Self-heating of optically pumped semiconductor (OPS) chip has been identifi ed as the major limiting factor of power scaling in OPS-based lasers in continuous wave (cw) mode. In this work, characterization of OPS lasers in short pulse (100 ns) and low duty cycle (1%) regime, where self-heating is negligible, as a function of the heat sink temperature is presented. The is data, combined with a rigorous thermal model, allows us to predict OPS chip performance in new cooling confi gurations for power scaling. Furthermore, the temperature dependent pulsed mode measurement data can be used to calibrate a temperature dependent gain model based on the 8-band kp method, taking the Auger coeffi cient as the fi tting parameter, thus allowing for predicting the performance of new structures. Th e pulsed-mode testing proved to be a valuable technique to reveal the OPS chip quality independent of the thermal management and to validate the OPS gain model.